quality
 
 
 
 

  ESI also provides customers with its Flash memory devices in die form. These devices are pre- tested fully at the factory to the same quality and reliability specifications as ESI's packaged devices. This ensures customers to minimize assembly yield loss due to faulty Flash devices when stacked vertically in spacesaving Multi Chip Packages(MCPs) or mounted horizontally with other memories and ASICs to form MCPs. ESI screens each device individually to provide customers with the consistent performance and reliability of its Flash memory products over life time at the rated temperature range and in the environments.

 


 
 
ESI's KGD Flash Portfolio
 
 
Density
Org.
( Bits )
Volt
Part. No.
Feature
Speed
(ns)
KGD Data
Sheet
32M
4M x 8,
2M x 16
3V ES29DL32X_KGD Top/
Bottom
70R/
90/120
32
32M
4M x 8,
2M x 16
3V ES29LV320E_KGD Top/
Bottom
70R/
90/120
16M
2M x 8,
1M x 16
3V ES29LV160E_KGD Top/
Bottom
70R/
90/120
8M
1M x 8,
512K x 16
3V ES29LV800E_KGD Top/
Bottom
70/90/120
4M
256K x 16,
512K x 8
3V
ES29LV400E_KGD Top/
Bottom
70/90/120